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Day: September 15, 2022

Avoiding Artifacts in EV samples:
Part 1 – the Use of Tween®

Avoiding Artifacts Figure 2: Analysis of PBS buffer containing 0.1% Tween®, using ZetaView® 488 system. A significant number of particles were measured, without EVs.

Along with generally accepted methods are some “tricks of the trade” such as the addition of Tween® or BSA; however, some of those additions are problematic.

Nanoparticle Tracking Analysis |Particle Metrix ZetaView® Icon Zeta Potential
Nanoparticle Tracking Analysis |Particle Metrix ZetaView® Icon Concentration
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Nanoparticle Tracking Analysis | Particle Metrix ZetaView® Icon Subpolulations
Nanoparticle Tracking Analysis |Particle Metrix ZetaView® Icon Fluorescence
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