ZetaView® Sample Analysis
Sample Analysis
With the variety of analysis methods for particle characterization, it can often be tedious to always have the right measuring device available and to utilize it to capacity. We offer the appropriate order analysis in our application laboratories. A complete consulting package completes our range of services.
We measure your products in a measuring range of 0.8 nm to 300 μm, if possible in original concentration!
Our services could be very useful to you. Challenge us, we will be happy to give you a taste of our capabilities in a technical discussion. On request, we will make you a non-binding offer.
For submitting samples, please use our Sample Submission Form: